Visual analysis of patent data through global maps and overlays
| Title: | Visual analysis of patent data through global maps and overlays |
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| Format: | Chapter |
| Publication Date: | 2017 |
| Published In: | Current Challenges in Patent Information Retrieval |
| Publisher | Springer |
| Ivan Allen College Contributors: | |
| External Contributors: | Luciano Kay, Ismael Rafols, Nils Newman |
| Citation: | Kay, L., Porter, A. L., Youtie, J., Newman, N., and Rafols, I. (2017). Visual analysis of patent data through global maps and overlays.” In Lupu, M., Mayer, K., Kando, N., and Trippe, T.(Eds.), Current Challenges in Patent Information Retrieval. (281-295). Berlin: Springer. |
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